Axial super-resolution evanescent wave tomography
نویسندگان
چکیده
منابع مشابه
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When an electromagnetic wave (light) in a dielectric medium of index n1 is incident upon an interface of a different dielectric material of a lower optical density, n2 at an angle θ1 greater than the critical angle, θc = sin−1(n2/n1), total internal reflection (TIR) occurs. Although all of the incident energy is reflected, an electromagnetic field with exponentially decreasing intensity propaga...
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ژورنال
عنوان ژورنال: Optics Letters
سال: 2016
ISSN: 0146-9592,1539-4794
DOI: 10.1364/ol.41.005499